Data di Pubblicazione:
1983
Abstract:
The geometry and electronic structure of H 2XO radicals have been investigated by means of non-empirical UHF and MNDO HE methods. The results show that σ radicals invariably have a planar equilibrium geometry, while π radicals are characterized by a variable degree of pyramidalization. The MNDO method and the STO-3G basis set provide unreliable geometric parameters, while 4-31G results are in good agreement with experimental data and more refined ab initio computations. The effect of the electronegativity of X and the number of valence electrons on the geometry of H 2XO radicals is rationalized in terms of the PMO model.
Tipologia CRIS:
1.1 Articolo in rivista
Elenco autori:
Barone, V.; Lelj, F.; Pastore, Annalisa; Cristnziano, P. L.; Russo, N.
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