Data di Pubblicazione:
1997
Abstract:
We studied the optical properties of high quality GaSb layers, grown by molecular beam epitaxy, in the region of the fundamental gap E0 using thermoreflectance spectroscopy in the temperature range between 80 and 300 K. The experimental line-shapes were analyzed with a functional form model including excitonic effects. Taking advantage of the derivative-like nature of the thermoreflectance spectroscopy, an accurate determination of the temperature dependence of the energy gap E0(T) is obtained, which is well reproduced by the semi-empirical Varshni relation.
Tipologia CRIS:
1.1 Articolo in rivista
Keywords:
Semiconductors, Epitaxy, Optical properties
Elenco autori:
Bellani, Vittorio; S., DI LERNIA; Geddo, Mario; Guizzetti, Giorgio; A., Bosacchi; S., Franchi; R., Magnanini
Link alla scheda completa:
Pubblicato in: