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Analog Front End of 50-Gbs SiGe BiCMOS Opto-Electrical Receiver in 3-D-Integrated Silicon Photonics Technology

Articolo
Data di Pubblicazione:
2022
Abstract:
This work presents a 3-D-integrated opto-electrical receiver (RX) analog front end (AFE) operating up to 50 Gbs. The electronic integrated circuit (EIC) is fabricated in ST SiGe BiCMOS-55-nm technology and flipped and mounted on top of the ST photonic integrated circuits (PICs) die through copper pillars (Cu-Pi). In the RX chain, a low-power fully differential shunt-feedback trans-impedance amplifier (FD SF-TIA) is exploited to reduce the input-referred noise. Following the TIA, a postamplifier (PA) based on a novel active feedback circuit topology extends the bandwidth (BW) and a buffer delivers the output electrical signal to the 100-Omega differential off-chip load. An automatic offset cancellation loop is included to protect the RX from any offset source at the input. The RX AFE consumes 56 mW from 1.8-V supply voltage and provides a trans-impedance (TI) gain of 78.7Omega with 27-GHz BW. By exploiting the FD SF-TIA with low parasitic capacitance of the germanium photodiodes (Ge-PD) in the photonic die as well as BW recovery by the PA, the RX achieves the sensitivity of -7.5-dBm OMA at Ge-PD and -2.3-dBm OMA at the single-mode fiber (SMF) optical output with bit error rate (BER) of <10-12 and PRBS-7. To the author's best knowledge, among published state-of-the-art 50-Gbs TIAs and RX exploiting SiGe BiCMOS technologies, this work proves the best energy efficiency ((pJbit)) and figure of merit (FoM) ( (GbpsA.mW) ) in terms of sensitivity and power consumption.
Tipologia CRIS:
1.1 Articolo in rivista
Keywords:
3-D-integrated; active feedback; limiting amplifier (LA); opto-electrical receiver (RX); trans-impedance amplifier (TIA)
Elenco autori:
Bozorgi, F.; Bruccoleri, M.; Rahimi, E.; Repossi, M.; Svelto, F.; Mazzanti, A.
Autori di Ateneo:
MAZZANTI ANDREA
SVELTO FRANCESCO
Link alla scheda completa:
https://iris.unipv.it/handle/11571/1451913
Link al Full Text:
https://iris.unipv.it//retrieve/handle/11571/1451913/652196/jssc-bozorgi-3094995-x.pdf
Pubblicato in:
IEEE JOURNAL OF SOLID-STATE CIRCUITS
Journal
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