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Scalable Manufacturing of Single Nanowire Devices Using Crack-Defined Shadow Mask Lithography

Articolo
Data di Pubblicazione:
2019
Abstract:
Single nanowires (NWs) have a broad range of applications in nanoelectronics, nanomechanics, and nano photonics, but, to date, no technique can produce single sub 20 nm wide NWs with electrical connections in a scalable fashion. In this work, we combine conventional optical and crack lithographies to generate single NW devices with controllable and predictable dimensions and placement and with individual electrical contacts to the NWs. We demonstrate NWs made of gold, platinum, palladium, tungsten, tin, and metal oxides. We have used conventional i-line stepper lithography with a nominal resolution of 365 nm to define crack lithography structures in a shadow mask for large-scale manufacturing of sub-20 nm wide NWs, which is a 20-fold improvement over the resolution that is possible with the utilized stepper lithography. Overall, the proposed method represents an effective approach to generate single NW devices with useful applications in electrochemistry, photonics, and gas- and biosensing.
Tipologia CRIS:
1.1 Articolo in rivista
Keywords:
crack lithography; gold nanodevices; metal nanowires; self-aligned electrodes; shadow mask evaporation; single nanowire devices
Elenco autori:
Enrico, Alessandro; Dubois, Valentin; Niklaus, Frank; Stemme, Göran
Autori di Ateneo:
ENRICO ALESSANDRO
Link alla scheda completa:
https://iris.unipv.it/handle/11571/1476759
Pubblicato in:
ACS APPLIED MATERIALS & INTERFACES
Journal
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URL

https://pubs.acs.org/doi/full/10.1021/acsami.8b19410
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