Probing the initial stages of solid-state reactions by total reflection EXAFS (reflEXAFS)

Academic Article

Publication Date:

2003

Iris type:

1.1 Articolo in rivista

Keywords:

ReflEXAFS; thin films; solid state reactions

List of contributors:

F., D’Acapito; Ghigna, Paolo; I., Alessandri; A., Cardelli; I., Davolic

Authors of the University:

GHIGNA PAOLO

Handle:

https://iris.unipv.it/handle/11571/15205

Published in:

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS

Journal