CMOS technologies in the 100 nm range for rad-hard front-end electronics in future collider experiments.

Academic Article

Publication Date:

2008

Iris type:

1.1 Articolo in rivista

Keywords:

nanoscale CMOS; ionizing radiation damage; noise measurements

List of contributors:

Re, V.; Gaioni, L.; Manghisoni, M.; Ratti, Lodovico; Speziali, Valeria; Traversi, G.

Authors of the University:

RATTI LODOVICO

Handle:

https://iris.unipv.it/handle/11571/117216

Published in:

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT

Journal