Electric current enhanced defect mobility in Ni3Ti intermetallics

Academic Article

Publication Date:

2004

Iris type:

1.1 Articolo in rivista

Keywords:

electromigration; defects; positron annihilation

List of contributors:

Garay, J. E.; Glade, S. C.; ANSELMI TAMBURINI, Umberto; ASOKA KUMAR, P.; Munir, Z. A.

Authors of the University:

ANSELMI TAMBURINI UMBERTO

Handle:

https://iris.unipv.it/handle/11571/132629

Published in:

APPLIED PHYSICS LETTERS

Journal