Resolution limits achievable with CMOS front-end in X and gamma-ray analysis with semiconductor detectors

Academic Article

Publication Date:

2003

Iris type:

1.1 Articolo in rivista

Keywords:

low-noise analog design; deep submicron CMSO processes; gamma-ray spectroscopy; X-ray spectroscopy

List of contributors:

Authors of the University:

RATTI LODOVICO

Handle:

Published in:

Journal