Resolution limits achievable with CMOS front-end in X and gamma-ray analysis with semiconductor detectors

Articolo
Data di Pubblicazione:
2003
Tipologia CRIS:
1.1 Articolo in rivista
Keywords:
low-noise analog design; deep submicron CMSO processes; gamma-ray spectroscopy; X-ray spectroscopy
Elenco autori:
Autori di Ateneo:
Link alla scheda completa:
https://iris.unipv.it/handle/11571/132791
Pubblicato in:
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT
Journal