A compact low-cost test equipment for thermal and electrical characterization of integrated circuits
Academic Article
Publication Date:
2009
Iris type:
1.1 Articolo in rivista
Keywords:
ATE; ELECTRO THERMAL MEASUREMENT SYSTEM; FPGA; USB; PELTIER CELL
List of contributors:
Cabrini, Alessandro; Gobbi, Laura; Baderna, Davide; Torelli, Guido
Published in: