Forecasting noise and radiation hardness of CMOS front-end electronics beyond the 100 nm frontier

Academic Article

Publication Date:

2010

Iris type:

1.1 Articolo in rivista

Keywords:

CMOS technologies; radiation hardness; low-noise analog front-end

List of contributors:

Re, V.; Gaioni, L.; Manghisoni, M.; Ratti, Lodovico; Traversi, G.

Authors of the University:

RATTI LODOVICO

Handle:

https://iris.unipv.it/handle/11571/215806

Published in:

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT

Journal