Introducing 65 nm CMOS technology in low-noise read-out of semiconductor detectors

Academic Article

Publication Date:

2010

Iris type:

1.1 Articolo in rivista

Keywords:

nanometer CMOS technologies; noise measurement; low-noise analog design

List of contributors:

Manghisoni, M.; Gaioni, L.; Ratti, Lodovico; Re, V.; Traversi, G.

Authors of the University:

RATTI LODOVICO

Handle:

https://iris.unipv.it/handle/11571/215811

Published in:

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT

Journal