Sensitive and robust second-harmonic interferometer for measuring the dispersion of the electro-optic coefficients in bulk materials

Second-harmonic interferometry (SHI) is proposed for measuring the electro-optic (EO) coefficients of massive media. It combines the advantages of interferometric techniques with the mechanical stability of single-beam methods, simultaneously skimming the wavelength dispersion of the EO response. For demonstrating the effectiveness of the SHI technique, the EO coefficients rT33 and rT13 of the EO crystal lithium niobate are measured simultaneously at 1064 and 532 nm.