65-nm CMOS Front-End Channel for Pixel Readout in the HL-LHC Radiation Environment

Academic Article

Publication Date:

2017

Iris type:

1.1 Articolo in rivista

Keywords:

Charge preamplifiers; CMOS processes; electronic noise; ionizing radiation effects; Nuclear and High Energy Physics; Nuclear Energy and Engineering; Electrical and Electronic Engineering

List of contributors:

Ratti, Lodovico; Gaioni, Luigi; Manghisoni, Massimo; Re, Valerio; Riceputi, Elisa; Traversi, Gianluca

Authors of the University:

RATTI LODOVICO

Handle:

https://iris.unipv.it/handle/11571/1209319

Published in:

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Journal

Overview

URL

http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=23

65-nm CMOS Front-End Channel for Pixel Readout in the HL-LHC Radiation Environment

Ratti, Lodovico; Gaioni, Luigi; Manghisoni, Massimo; Re, Valerio; Riceputi, Elisa; Traversi, Gianluca

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Overview

URL