Total Ionizing Dose effects in 130-nm commercial CMOS technologies for HEP experiments

Academic Article

Publication Date:

2007

Iris type:

1.1 Articolo in rivista

Keywords:

ionizing radiation damage; CMOS processes; rad-hard design; low-noise analog front-end

List of contributors:

Authors of the University:

RATTI LODOVICO

Handle:

Published in:

Journal