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PHOTOREFLECTANCE VERSUS PHOTOLUMINESCENCE IN STRAIN INDUCED QUANTUM WELL WIRES

Articolo
Data di Pubblicazione:
1996
Abstract:
Photoreflectance vs photoluminescence measurements of stress-induced quantum wires, obtained by patterning an InGaAs layer pseudomorphic grown on a GaAs well in wire-shaped stressors, are presented and compared. An excellent agreement was found between the experimental results obtained with the two techniques about the lateral confinement of the carriers and evidence is given at room temperature of quantization in two directions by means of photoreflectance.
Tipologia CRIS:
1.1 Articolo in rivista
Keywords:
Nanostructures, Optical properties, Light absorption and reflection, Luminescence
Elenco autori:
Geddo, Mario; S., DI LERNIA; A., Stella; A., Bosacchi; S., Franchi; M. GENTILI AND D., Peschiaroli
Link alla scheda completa:
https://iris.unipv.it/handle/11571/106289
Pubblicato in:
SOLID STATE COMMUNICATIONS
Journal
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