Data di Pubblicazione:
2005
Abstract:
Polycrystalline samples and thin films of the x =0.8 member of the CexGd1xO2y solid solution have been successfully prepared. Their structural and transport properties have been studied by means of X-ray diffraction and electrical conductivity measurements as a function of preparation route, grain size, substrate nature and film thickness. Our data shows that the substrate roughness plays a relevant role in affecting
the final r; however, by optimizing the thin films preparation conditions we showed that the conductivity of CGO material is always greater than that of the state-of-the-art oxide conductor, the YSZ 8 mol%, even though an electronic contribution ranging from 10% to 20% was found.
the final r; however, by optimizing the thin films preparation conditions we showed that the conductivity of CGO material is always greater than that of the state-of-the-art oxide conductor, the YSZ 8 mol%, even though an electronic contribution ranging from 10% to 20% was found.
Tipologia CRIS:
1.1 Articolo in rivista
Keywords:
SOLID STATE IONICS; THIN FILMS; SOFC
Elenco autori:
Chiodelli, Gaetano; Malavasi, Lorenzo; Massarotti, Vincenzo; Mustarelli, Piercarlo; Quartarone, Eliana
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