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Benchmarking the Use of Heavily Doped Ge for Plasmonics and Sensing in the Mid-Infrared

Articolo
Data di Pubblicazione:
2018
Abstract:
Despite the recent introduction of heavily doped semiconductors for mid-infrared plasmonics, it still remains an open issue whether such materials can compete with noble metals. A whole set of figures of merit are employed to thoroughly assess the use of heavily doped Ge on Si as a mid-infrared plasmonic material and benchmark it against standard noble metals such as Au. A full-wave electrodynamics framework is used to model and design high-performance, silicon-foundry compatible mid-infrared plasmonic sensors based on experimental material data reaching plasma wavelengths down to λp ∼ 3.1 μm. It is finally shown that Ge sensors can provide signal enhancements for vibrational spectroscopy above the 3 orders of magnitude, thus, representing a promising alternative to noble metals, leveraging the full compatibility with the silicon foundry microfabrication processes.
Tipologia CRIS:
1.1 Articolo in rivista
Keywords:
germanium; heavy-doping; mid-infrared; plasmonics; sensing
Elenco autori:
Pellegrini, G.; Baldassare, L.; Giliberti, V.; Frigerio, J.; Gallacher, K.; Paul, D. J.; Isella, G.; Ortolani, M.; Biagioni, P.
Autori di Ateneo:
PELLEGRINI GIOVANNI
Link alla scheda completa:
https://iris.unipv.it/handle/11571/1493547
Pubblicato in:
ACS PHOTONICS
Journal
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