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Ge-on-Si based mid-infrared plasmonics

Contributo in Atti di convegno
Data di Pubblicazione:
2021
Abstract:
In the last decade, silicon photonics has undergone an impressive development driven by an increasing number of technological applications. Plasmonics has not yet made its way to the microelectronic industry, mostly because of the lack of compatibility of typical plasmonic materials with foundry processes. In this framework, we have developed a plasmonic platform based on heavily n-doped Ge grown on silicon substrates. We developed growth protocols to reach n-doping levels exceeding 1020 cm-3, allowing us to tune the plasma wavelength of Ge in the 3-15 µm range. The plasmonic resonances of Ge-on-Si nanoantennas have been predicted by simulations, confirmed by experimental spectra and exploited for molecular sensing. Our work represents a benchmark for group-IV mid-IR plasmonics.
Tipologia CRIS:
4.1 Contributo in Atti di convegno
Keywords:
Doping; Germanium; Mid-infrared; Plasmonics; Sensing
Elenco autori:
Frigerio, J.; Baldassarre, L.; Pellegrini, G.; Fischer, M. P.; Gallacher, K.; Millar, R.; Ballabio, A.; Brida, D.; Isella, G.; Napolitani, E.; Paul, D. J.; Ortolani, M.; Biagioni, P.
Autori di Ateneo:
PELLEGRINI GIOVANNI
Link alla scheda completa:
https://iris.unipv.it/handle/11571/1493616
Titolo del libro:
Proceedings of SPIE - The International Society for Optical Engineering
Pubblicato in:
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Journal
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Series
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